Facilities

Selected Instruments at MCEE

Materials Processing and Preparation

Centorr 5BJ Arc Melting Furnace with Drop-Cast Capability

Pascal Technologies Vacuum System with Hydrogen Flush for Diffusion Couple Assembly

Struer RotoPol-11 and RotoForce Specimen Preparation System

Allied High Tech M-Prep 3 Grinding/Polishing Machine

Buehler Isomet Low Speed Saw (2)

Allied High Tech Low Speed Saw

Ar-Atmosphere Glovebox for Handling of Rare Earth Metals and Alloys

Heat Treatment and Materials Testing

CM 1710 Rapid High Temperature (1700ºC) Furnace with Vertical Cycling Capability

Thermolyne 46100 Programmable High Temperature (1700ºC) Muffle Furnace

Lindberg/3M 3-Zone Tube Furnaces (3) with Independent Controllers (1100ºC)

Thermolyne Single Zone Tube Furnace (1500ºC) for High Temperature / Environmental Control with In-House Built Thermotransport Rig (Temperature Gradient Testing)

Fisher Scientific Isotemp Programmable Furnace (1000ºC)

2 Paragon BlueBird Kilns/Furnaces (650ºC)

Materials Analysis and Characterization

Electrochemical Impedance Spectrometer - IM6e BAS Zahner Impedance System

Perkin-Elmer Pyris 1 Differential Scanning Calorimeter (DSC)

Perkin-Elmer Thermal Gravimetric Analyzer (TGA) 7

Perkin-Elmer Dynamic Mechanical Analyzer (DMA) 7e

Perkin-Elmer Differential Temperature Analyzer (DTA) 7

TA Instrument SDT 2960 Simultaneous DSC/TGA

Nikon Optical Microscope with Nomalski Capability and Nikon Optical Streoscope (Digital Image Capturing and Processing)

Instron Satec 11 Universal Mechanical Tester

Satec T-5000 Universal Mechanical Tester

SUN and Macintosh Workstations Computation and Programming (Python, C/C++/Fortran)

Materials Characterization Facility (MCF) at University of Central Florida

Website - http://www.ampac.ucf.edu/facilities/MCF.php

FEI Tecnai 30 Transmission Electron Microscope / Scanning Transmission Electron Microscope (BF, DF, HAADF, EDS, EELS)

ZEISS Ultra-55 Field Emission Scanning Electron Microscope (SE, BSE, EDS, STEM, Electron Lithography)

Hitach S-800 Field Emission Scanning Electron Microscope (SE, BSE, EDS)

JEOL 6480LV Scanning Electron Microscope (SE, BSE, EDS, EBSD)

JEOL 1100B Transmission Electron Microscope (BF, DF, EDS)

JEOL 733 Electron Microprobe Analysis (SE, BSE, EDS, 4 Crystals WDS)

CAMECA IMS-3F Secondary Ion Mass Spectroscope

PHI Adept 1010 Dynamic Secondary Ion Mass Spectroscope

Physica Electronics 600 Scanning Auger Spectroscope

Physica Electronics 5400 X-ray Photoluminescence Spectroscope

General Ionix 1.7MU Tandetron Rutherford Backscatter Spectroscope